Maximum field emission current density of CuO nanowires: theoretical study using a defect-related semiconductor field emission model and in situ measurements.
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Maximum field emission current density of CuO nanowires: theoretical study using a defect-related semiconductor field emission model and in situ measurements.
description
2018 nî lūn-bûn
@nan
2018年の論文
@ja
2018年学术文章
@wuu
2018年学术文章
@zh
2018年学术文章
@zh-cn
2018年学术文章
@zh-hans
2018年学术文章
@zh-my
2018年学术文章
@zh-sg
2018年學術文章
@yue
2018年學術文章
@zh-hant
name
Maximum field emission current ...... odel and in situ measurements.
@en
Maximum field emission current ...... odel and in situ measurements.
@nl
type
label
Maximum field emission current ...... odel and in situ measurements.
@en
Maximum field emission current ...... odel and in situ measurements.
@nl
prefLabel
Maximum field emission current ...... odel and in situ measurements.
@en
Maximum field emission current ...... odel and in situ measurements.
@nl
P2093
P2860
P1433
P1476
Maximum field emission current ...... odel and in situ measurements.
@en
P2093
Juncong She
Ningsheng Xu
Shaozhi Deng
Yicong Chen
Zufang Lin
P2860
P2888
P356
10.1038/S41598-018-20575-Y
P407
P50
P577
2018-02-01T00:00:00Z