Quantification of In-Contact Probe-Sample Electrostatic Forces with Dynamic Atomic Force Microscopy.
about
Quantification of In-Contact Probe-Sample Electrostatic Forces with Dynamic Atomic Force Microscopy.
description
2016 nî lūn-bûn
@nan
2016年の論文
@ja
2016年学术文章
@wuu
2016年学术文章
@zh
2016年学术文章
@zh-cn
2016年学术文章
@zh-hans
2016年学术文章
@zh-my
2016年学术文章
@zh-sg
2016年學術文章
@yue
2016年學術文章
@zh-hant
name
Quantification of In-Contact P ...... namic Atomic Force Microscopy.
@en
Quantification of In-Contact P ...... namic Atomic Force Microscopy.
@nl
type
label
Quantification of In-Contact P ...... namic Atomic Force Microscopy.
@en
Quantification of In-Contact P ...... namic Atomic Force Microscopy.
@nl
prefLabel
Quantification of In-Contact P ...... namic Atomic Force Microscopy.
@en
Quantification of In-Contact P ...... namic Atomic Force Microscopy.
@nl
P2093
P50
P356
P1433
P1476
Quantification of In-Contact P ...... namic Atomic Force Microscopy.
@en
P2093
Ben Carmichael
Nina Balke
Stephen Jesse
P356
10.1088/1361-6528/AA5370
P577
2016-12-13T00:00:00Z
P698
P818
1610.03635