Microimaging at 14 tesla using GESEPI for removal of magnetic susceptibility artifacts in T(2)(*)-weighted image contrast.
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Microimaging at 14 tesla using GESEPI for removal of magnetic susceptibility artifacts in T(2)(*)-weighted image contrast.
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1999 nî lūn-bûn
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1999年の論文
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1999年学术文章
@wuu
1999年学术文章
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1999年学术文章
@zh-cn
1999年学术文章
@zh-hans
1999年学术文章
@zh-my
1999年学术文章
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1999年學術文章
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1999年學術文章
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name
Microimaging at 14 tesla using ...... susceptibility artifacts in T
@nl
Microimaging at 14 tesla using ...... 2)(*)-weighted image contrast.
@en
type
label
Microimaging at 14 tesla using ...... susceptibility artifacts in T
@nl
Microimaging at 14 tesla using ...... 2)(*)-weighted image contrast.
@en
prefLabel
Microimaging at 14 tesla using ...... susceptibility artifacts in T
@nl
Microimaging at 14 tesla using ...... 2)(*)-weighted image contrast.
@en
P2093
P356
P1476
Microimaging at 14 tesla using ...... 2)(*)-weighted image contrast.
@en
P2093
P356
10.1006/JMRE.1999.1900
P577
1999-11-01T00:00:00Z