Intensity calibration and flat-field correction for fluorescence microscopes.
about
Intensity calibration and flat-field correction for fluorescence microscopes.
description
2014 nî lūn-bûn
@nan
2014年の論文
@ja
2014年学术文章
@wuu
2014年学术文章
@zh-cn
2014年学术文章
@zh-hans
2014年学术文章
@zh-my
2014年学术文章
@zh-sg
2014年學術文章
@yue
2014年學術文章
@zh
2014年學術文章
@zh-hant
name
Intensity calibration and flat-field correction for fluorescence microscopes.
@en
Intensity calibration and flat-field correction for fluorescence microscopes.
@nl
type
label
Intensity calibration and flat-field correction for fluorescence microscopes.
@en
Intensity calibration and flat-field correction for fluorescence microscopes.
@nl
prefLabel
Intensity calibration and flat-field correction for fluorescence microscopes.
@en
Intensity calibration and flat-field correction for fluorescence microscopes.
@nl
P2860
P1476
Intensity calibration and flat-field correction for fluorescence microscopes.
@en
P2093
Michael Model
P2860
P304
10.14.1-10
P356
10.1002/0471142956.CY1014S68
P577
2014-04-01T00:00:00Z