X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis.

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X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis.

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2017 nî lūn-bûn

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2017年の論文

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2017年学术文章

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2017年学术文章

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2017年学术文章

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2017年学术文章

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2017年学术文章

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2017年学术文章

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2017年學術文章

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2017年學術文章

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X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis.

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X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis.

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label

X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis.

@en

X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis.

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X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis.

@en

X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis.

@nl

P1476

X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis

@en

P2093

Arndt Last

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Christoph Rau

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Jenny Romell

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Tunhe Zhou

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P2860

Differential x-ray phase contrast imaging using a shearing interferometer

Phase-contrast imaging using polychromatic hard X-rays

Two-Dimensional X-Ray Grating Interferometer

Motionless phase stepping in X-ray phase contrast imaging with a compact source

High-resolution scanning x-ray diffraction microscopy.

Multicontrast x-ray computed tomography imaging using Talbot-Lau interferometry without phase stepping

Fractional Talbot imaging of phase gratings with hard x rays.

Hard-X-ray dark-field imaging using a grating interferometer.

X-ray phase imaging with a grating interferometer.

A two-directional approach for grating based differential phase contrast imaging using hard x-rays.

P304

203903

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scholarly article

P356

10.1103/PHYSREVLETT.118.203903

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English

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P478

118

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P50

Irene Zanette

Marie-Christine Zdora

Pierre Thibault

Frieder Koch

Simone Sala

P577

2017-05-18T00:00:00Z

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P698

28581800

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