Tip and surface determination from experiments and simulations of scanning tunneling microscopy and spectroscopy.
about
Complex patterning by vertical interchange atom manipulation using atomic force microscopy.Addressing metal centres in supramolecular assemblies.A high-precision digital integrator based on the Romberg algorithm.Ab initiostudy of height contrast in scanning tunneling microscopy of Ge/Si surface layers grown on Si(111) in presence of Bi
P2860
Tip and surface determination from experiments and simulations of scanning tunneling microscopy and spectroscopy.
description
2005 nî lūn-bûn
@nan
2005年の論文
@ja
2005年学术文章
@wuu
2005年学术文章
@zh
2005年学术文章
@zh-cn
2005年学术文章
@zh-hans
2005年学术文章
@zh-my
2005年学术文章
@zh-sg
2005年學術文章
@yue
2005年學術文章
@zh-hant
name
Tip and surface determination ...... g microscopy and spectroscopy.
@en
Tip and surface determination ...... g microscopy and spectroscopy.
@nl
type
label
Tip and surface determination ...... g microscopy and spectroscopy.
@en
Tip and surface determination ...... g microscopy and spectroscopy.
@nl
prefLabel
Tip and surface determination ...... g microscopy and spectroscopy.
@en
Tip and surface determination ...... g microscopy and spectroscopy.
@nl
P2860
P1476
Tip and surface determination ...... ng microscopy and spectroscopy
@en
P2093
Iván Brihuega
P2860
P304
P356
10.1103/PHYSREVLETT.94.056103
P407
P577
2005-02-11T00:00:00Z
P698
P818
cond-mat/0411259