Time-Resolved Imaging of Negative Differential Resistance on the Atomic Scale.
about
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics.Dynamical Negative Differential Resistance in Antiferromagnetically Coupled Few-Atom Spin Chains.Realization of a Hole-Doped Mott Insulator on a Triangular Silicon Lattice.
P2860
Time-Resolved Imaging of Negative Differential Resistance on the Atomic Scale.
description
2016 nî lūn-bûn
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2016年の論文
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2016年学术文章
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2016年学术文章
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2016年学术文章
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2016年学术文章
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2016年学术文章
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2016年学术文章
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2016年學術文章
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name
Time-Resolved Imaging of Negative Differential Resistance on the Atomic Scale.
@en
Time-Resolved Imaging of Negative Differential Resistance on the Atomic Scale.
@nl
type
label
Time-Resolved Imaging of Negative Differential Resistance on the Atomic Scale.
@en
Time-Resolved Imaging of Negative Differential Resistance on the Atomic Scale.
@nl
prefLabel
Time-Resolved Imaging of Negative Differential Resistance on the Atomic Scale.
@en
Time-Resolved Imaging of Negative Differential Resistance on the Atomic Scale.
@nl
P2093
P2860
P1476
Time-Resolved Imaging of Negative Differential Resistance on the Atomic Scale.
@en
P2093
Erika Lloyd
Isil Ozfidan
Jason L Pitters
Marco Taucer
Mohammad Koleini
Mohammad Rashidi
Robert A Wolkow
P2860
P304
P356
10.1103/PHYSREVLETT.117.276805
P407
P577
2016-12-30T00:00:00Z
P698
P818
1608.06344