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Free Form Deformation-Based Image Registration Improves Accuracy of Traction Force Microscopy.High-resolution traction force microscopy on small focal adhesions - improved accuracy through optimal marker distribution and optical flow tracking.Full L1-regularized Traction Force Microscopy over whole cells
P2860
description
2014 nî lūn-bûn
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2014年の論文
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2014年学术文章
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name
Validation tool for traction force microscopy.
@en
Validation tool for traction force microscopy.
@nl
type
label
Validation tool for traction force microscopy.
@en
Validation tool for traction force microscopy.
@nl
prefLabel
Validation tool for traction force microscopy.
@en
Validation tool for traction force microscopy.
@nl
P2860
P1476
Validation tool for traction force microscopy.
@en
P2093
A Jorge-Peñas
A Muñoz-Barrutia
P2860
P304
P356
10.1080/10255842.2014.903934
P577
2014-04-04T00:00:00Z