about
Sub-angstrom low-voltage performance of a monochromated, aberration-corrected transmission electron microscope.The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois.Microscopic origins for stabilizing room-temperature ferromagnetism in ultrathin manganite layersRetro-fitting an older (S)TEM with two Cs aberration correctors for 80 kV and 60 kV operation.Facility implementation and comparative performance evaluation of probe-corrected TEM/STEM with Schottky and cold field emission illumination.Influence of mechanical noise inside a scanning electron microscope.Atomap: a new software tool for the automated analysis of atomic resolution images using two-dimensional Gaussian fitting.Periodic artifact reduction in Fourier transforms of full field atomic resolution images.Acoustic buffeting by infrasound in a low vibration facility.Chemistry of Ruddlesden–Popper planar faults at a ferroelectric–ferromagnet perovskite interface
P2860
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P2860
description
2006 nî lūn-bûn
@nan
2006年の論文
@ja
2006年学术文章
@wuu
2006年学术文章
@zh
2006年学术文章
@zh-cn
2006年学术文章
@zh-hans
2006年学术文章
@zh-my
2006年学术文章
@zh-sg
2006年學術文章
@yue
2006年學術文章
@zh-hant
name
Room design for high-performance electron microscopy.
@en
Room design for high-performance electron microscopy.
@nl
type
label
Room design for high-performance electron microscopy.
@en
Room design for high-performance electron microscopy.
@nl
prefLabel
Room design for high-performance electron microscopy.
@en
Room design for high-performance electron microscopy.
@nl
P2093
P1433
P1476
Room design for high-performance electron microscopy.
@en
P2093
David A Muller
Earl J Kirkland
John L Grazul
Lena Fitting
Malcolm G Thomas
P304
P356
10.1016/J.ULTRAMIC.2006.04.017
P577
2006-07-05T00:00:00Z