Examination of the possibility of negative capacitance using ferroelectric materials in solid state electronic devices.
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Examination of the possibility of negative capacitance using ferroelectric materials in solid state electronic devices.
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2011 nî lūn-bûn
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2011年の論文
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2011年学术文章
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2011年学术文章
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2011年学术文章
@zh-cn
2011年学术文章
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2011年学术文章
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2011年学术文章
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2011年學術文章
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2011年學術文章
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name
Examination of the possibility ...... olid state electronic devices.
@en
Examination of the possibility ...... olid state electronic devices.
@nl
type
label
Examination of the possibility ...... olid state electronic devices.
@en
Examination of the possibility ...... olid state electronic devices.
@nl
prefLabel
Examination of the possibility ...... olid state electronic devices.
@en
Examination of the possibility ...... olid state electronic devices.
@nl
P2093
P356
P1433
P1476
Examination of the possibility ...... olid state electronic devices.
@en
P2093
C M Krowne
L M B Alldredge
S W Kirchoefer
P304
P356
10.1021/NL1037215
P407
P577
2011-01-31T00:00:00Z