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Wavelets filtering for classification of very noisy electron microscopic single particles images--application on structure determination of VP5-VP19C recombinantA primer to single-particle cryo-electron microscopyCryo-EM reveals an active role for aminoacyl-tRNA in the accommodation processParticle-verification for single-particle, reference-based reconstruction using multivariate data analysis and classification.Image segmentation for automatic particle identification in electron micrographs based on hidden Markov random field models and expectation maximization.Texture indicators for segmentation of polyomavirus particles in transmission electron microscopy images.Location of translational initiation factor IF3 on the small ribosomal subunit.Robust w-Estimators for Cryo-EM Class MeansVisualization of elongation factor G on the Escherichia coli 70S ribosome: the mechanism of translocationAutomated determination of size and morphology information from soot transmission electron microscope (TEM)-generated images
P2860
Q24805865-09407FF8-15AA-473D-B055-79F5113160A7Q27322872-6D76959A-68F0-4748-9B04-E2B5E51C721FQ27639298-92210228-0261-400E-9665-4ECA18EBB2C6Q31162295-2911637A-6430-448C-B383-FE9FCB964811Q34205678-6AD34F86-8DED-4311-BEE6-253F027DC8E7Q34774973-8F8842FD-CE08-4143-BCD5-A9653F82C56DQ35124122-D5412440-4F01-408E-A432-A9AF86F2E0FBQ36913704-DB4E65B0-32C6-40ED-BB29-4DADCBECDF57Q37382075-704CA261-D17E-4ACD-BEAC-A7DECC7FC5BEQ58609786-E2313B8A-0B8D-451C-8729-F1DF8133DD5B
P2860
description
1995 nî lūn-bûn
@nan
1995年の論文
@ja
1995年学术文章
@wuu
1995年学术文章
@zh
1995年学术文章
@zh-cn
1995年学术文章
@zh-hans
1995年学术文章
@zh-my
1995年学术文章
@zh-sg
1995年學術文章
@yue
1995年學術文章
@zh-hant
name
Automatic particle picking from electron micrographs.
@en
Automatic particle picking from electron micrographs.
@nl
type
label
Automatic particle picking from electron micrographs.
@en
Automatic particle picking from electron micrographs.
@nl
prefLabel
Automatic particle picking from electron micrographs.
@en
Automatic particle picking from electron micrographs.
@nl
P2093
P1433
P1476
Automatic particle picking from electron micrographs.
@en
P2093
P304
P356
10.1016/0304-3991(95)00002-I
P577
1995-06-01T00:00:00Z