Time-of-flight secondary ion mass spectroscopy characterization of the covalent bonding between a carbon surface and aryl groups.

Time-of-flight secondary ion mass spectroscopy characterization of the covalent bonding between a carbon surface and aryl groups.

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http://www.wikidata.org/entity/Q52971383
Normal and surface-enhanced Raman spectroscopy of nitroazobenzene submonolayers and multilayers on carbon and silver surfaces.Aryl Diazonium Chemistry for the Surface Functionalization of Glassy BiosensorsAryl diazonium salts: a new class of coupling agents for bonding polymers, biomacromolecules and nanoparticles to surfaces.Electrografting: a powerful method for surface modification.Structure and Modification of Electrode Materials for Protein Electrochemistry.Catalytic Activity of Ultrathin Pt Films on Aligned Carbon Nanotube Arrays.Enhanced Electro-Static Modulation of Ionic Diffusion through Carbon Nanotube Membranes by Diazonium Grafting Chemistry.Facile degradation of benzenediazonium-grafted thick layers on the electrode surface enabling electrochemical biosensor application.Ultraviolet-visible spectroelectrochemistry of chemisorbed molecular layers on optically transparent carbon electrodes.Mapping fluxes of radicals from the combination of electrochemical activation and optical microscopy.Carbon/molecule/metal molecular electronic junctions: the importance of "contacts".Chemical modification of graphene characterized by Raman and transport experiments.Polymer Grafting to Aryl Diazonium-Modified Materials: Methods and ApplicationsMultifunctional Carbon for Electrochemical Double-Layer CapacitorsDevelopment of Surface Activated Screen‐Printed Carbon Transducers for Biosensors Application
P2860

Time-of-flight secondary ion mass spectroscopy characterization of the covalent bonding between a carbon surface and aryl groups.

Item
http://www.wikidata.org/entity/Q52971383
description
2005 nî lūn-bûn
@nan
2005年の論文
@ja
2005年学术文章
@wuu
2005年学术文章
@zh
2005年学术文章
@zh-cn
2005年学术文章
@zh-hans
2005年学术文章
@zh-my
2005年学术文章
@zh-sg
2005年學術文章
@yue
2005年學術文章
@zh-hant
name
Time-of-flight secondary ion m ...... arbon surface and aryl groups.
@en
Time-of-flight secondary ion m ...... arbon surface and aryl groups.
@nl
type
label
Time-of-flight secondary ion m ...... arbon surface and aryl groups.
@en
Time-of-flight secondary ion m ...... arbon surface and aryl groups.
@nl
prefLabel
Time-of-flight secondary ion m ...... arbon surface and aryl groups.
@en
Time-of-flight secondary ion m ...... arbon surface and aryl groups.
@nl
P1433
P1476
P2093
P304
P31
P356
P407
P433
P478
P577
P5875
P698
P356
P1433
P1476
Time-of-flight secondary ion m ...... arbon surface and aryl groups.
@en
P2093
P304
P31
P356
P407
P433
P478
P577
P5875
P698