Imaging and manipulation of the Si(100) surface by small-amplitude NC-AFM at zero and very low applied bias.
about
Nano-contact microscopy of supracrystals.Structural development and energy dissipation in simulated silicon apices.Vertical atomic manipulation with dynamic atomic-force microscopy without tip change via a multi-step mechanism.Simultaneous noncontact AFM and STM of Ag:Si(111)-(3×3)R30∘Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces
P2860
Imaging and manipulation of the Si(100) surface by small-amplitude NC-AFM at zero and very low applied bias.
description
2012 nî lūn-bûn
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2012年の論文
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2012年学术文章
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2012年学术文章
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2012年学术文章
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2012年学术文章
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2012年学术文章
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2012年學術文章
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2012年學術文章
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2012年學術文章
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name
Imaging and manipulation of the Si
@nl
Imaging and manipulation of th ...... ero and very low applied bias.
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type
label
Imaging and manipulation of the Si
@nl
Imaging and manipulation of th ...... ero and very low applied bias.
@en
prefLabel
Imaging and manipulation of the Si
@nl
Imaging and manipulation of th ...... ero and very low applied bias.
@en
P356
P1476
Imaging and manipulation of th ...... zero and very low applied bias
@en
P2093
S Gangopadhyay
P304
P356
10.1088/0953-8984/24/8/084009
P577
2012-02-07T00:00:00Z