Applications of microstructured silicon wafers as internal reflection elements in attenuated total reflection Fourier transform infrared spectroscopy.
about
Applications of microstructured silicon wafers as internal reflection elements in attenuated total reflection Fourier transform infrared spectroscopy.
description
2010 nî lūn-bûn
@nan
2010年の論文
@ja
2010年学术文章
@wuu
2010年学术文章
@zh
2010年学术文章
@zh-cn
2010年学术文章
@zh-hans
2010年学术文章
@zh-my
2010年学术文章
@zh-sg
2010年學術文章
@yue
2010年學術文章
@zh-hant
name
Applications of microstructure ...... ansform infrared spectroscopy.
@en
Applications of microstructure ...... ansform infrared spectroscopy.
@nl
type
label
Applications of microstructure ...... ansform infrared spectroscopy.
@en
Applications of microstructure ...... ansform infrared spectroscopy.
@nl
prefLabel
Applications of microstructure ...... ansform infrared spectroscopy.
@en
Applications of microstructure ...... ansform infrared spectroscopy.
@nl
P2093
P1433
P1476
Applications of microstructure ...... ansform infrared spectroscopy.
@en
P2093
Boris Vasilev
Henrik Schumacher
Johann W Bartha
Ulrich Künzelmann
P2860
P304
P356
10.1366/000370210792434404
P577
2010-09-01T00:00:00Z