Analysis of Submonolayers on Silver by Negative Secondary Ion Emission
about
Elemental imaging at the nanoscale: NanoSIMS and complementary techniques for element localisation in plants.Detecting metabolic activities in single cells, with emphasis on nanoSIMS.Yields and images of secondary ions from organic materials by different primary Bi ions in time-of-flight secondary ion mass spectrometry.
P2860
Analysis of Submonolayers on Silver by Negative Secondary Ion Emission
description
article
@en
im Januar 1969 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в 1969
@uk
ലേഖനം
@ml
name
Analysis of Submonolayers on Silver by Negative Secondary Ion Emission
@en
Analysis of Submonolayers on Silver by Negative Secondary Ion Emission
@nl
type
label
Analysis of Submonolayers on Silver by Negative Secondary Ion Emission
@en
Analysis of Submonolayers on Silver by Negative Secondary Ion Emission
@nl
prefLabel
Analysis of Submonolayers on Silver by Negative Secondary Ion Emission
@en
Analysis of Submonolayers on Silver by Negative Secondary Ion Emission
@nl
P356
P1476
Analysis of Submonolayers on Silver by Negative Secondary Ion Emission
@en
P2093
A. Benninghoven
P304
P356
10.1002/PSSB.19690340267
P577
1969-01-01T00:00:00Z