Identification of nanoindentation-induced phase changes in silicon by in situ electrical characterization
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Experimental evidence for semiconducting behavior of Si-XIIStructural characterization of B-doped diamond nanoindentation tipsRate-dependent phase transformations in nanoindented germaniumUnderstanding pressure-induced phase-transformation behavior in silicon through in situ electrical probing under cyclic loading conditionsFormation and growth of nanoindentation-induced high pressure phases in crystalline and amorphous silicon
P2860
Identification of nanoindentation-induced phase changes in silicon by in situ electrical characterization
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im April 2007 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
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наукова стаття, опублікована у квітні 2007
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name
Identification of nanoindentat ...... tu electrical characterization
@en
Identification of nanoindentat ...... tu electrical characterization
@nl
type
label
Identification of nanoindentat ...... tu electrical characterization
@en
Identification of nanoindentat ...... tu electrical characterization
@nl
prefLabel
Identification of nanoindentat ...... tu electrical characterization
@en
Identification of nanoindentat ...... tu electrical characterization
@nl
P2093
P2860
P356
P1476
Identification of nanoindentat ...... tu electrical characterization
@en
P2093
J. E. Bradby
J. S. Williams
N. Fujisawa
S. Ruffell
P2860
P304
P356
10.1063/1.2724803
P577
2007-04-15T00:00:00Z