about
EEL spectroscopic tomography: towards a new dimension in nanomaterials analysis.Insight into the compositional and structural nano features of AlN/GaN DBRs by EELS-HAADF.EELS tomography in multiferroic nanocomposites: from spectrum images to the spectrum volume.Retrieving the electronic properties of silicon nanocrystals embedded in a dielectric matrix by low-loss EELS.Electron energy loss spectroscopy on semiconductor heterostructures for optoelectronics and photonics applications.Quantitative parameters for the examination of InGaN QW multilayers by low-loss EELS.Optoelectronic properties of InAlN/GaN distributed bragg reflector heterostructure examined by valence electron energy loss spectroscopy.Density Functional Theory Modeling of Low-Loss Electron Energy-Loss Spectroscopy in Wurtzite III-Nitride Ternary Alloys.Structural and compositional properties of Er-doped silicon nanoclusters/oxides for multilayered photonic devices studied by STEM-EELS.Electron energy-loss spectroscopic tomography of FexCo(3-x)O4 impregnated Co3O4 mesoporous particles: unraveling the chemical information in three dimensions.3D Visualization of the Iron Oxidation State in FeO/Fe3O4 Core–Shell Nanocubes from Electron Energy Loss TomographyMulti-focus TIE algorithm including partial spatial coherence and overlapping filtersPrecessed electron beam electron energy loss spectroscopy of graphene: Beyond channelling effectsInsight into high-reflectivity AlN/GaN Bragg reflectors with spontaneously formed (Al,Ga)N transient layers at the interfaces(Invited) Optimizing Er-Doped Layer Stacks for Integrated Light Emitting Devices(V)EELS Characterization of InAlN/GaN Distributed Bragg Reflectors
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description
researcher
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wetenschapper
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հետազոտող
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name
A Eljarrat
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A Eljarrat
@nl
Alberto Eljarrat
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Alberto Eljarrat
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type
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A Eljarrat
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A Eljarrat
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Alberto Eljarrat
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Alberto Eljarrat
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A Eljarrat
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A Eljarrat
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A Eljarrat
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Alberto Eljarrat
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Alberto Eljarrat
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P106
P1153
54419940800
P21
P31
P496
0000-0002-0968-5195