about
Cryogenic current-in-plane tunneling apparatus.Breakthrough in current-in-plane tunneling measurement precision by application of multi-variable fitting algorithm.A self-adjustable four-point probing system using polymeric three dimensional coils and non-toxic liquid metal.Enhanced functionality of cantilever based mass sensors using higher modes
P2860
description
im Januar 2002 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в січні 2002
@uk
name
Scanning microscopic four-point conductivity probes
@en
Scanning microscopic four-point conductivity probes
@nl
type
label
Scanning microscopic four-point conductivity probes
@en
Scanning microscopic four-point conductivity probes
@nl
prefLabel
Scanning microscopic four-point conductivity probes
@en
Scanning microscopic four-point conductivity probes
@nl
P2093
P50
P1476
Scanning microscopic four-point conductivity probes
@en
P2093
C.L Petersen
T Hassenkam
T.M Hansen
P356
10.1016/S0924-4247(01)00765-8
P577
2002-01-01T00:00:00Z