Time resolved Raman spectroscopy for depth analysis of multi-layered mineral samples
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Fluorescence-suppressed time-resolved Raman spectroscopy of pharmaceuticals using complementary metal-oxide semiconductor (CMOS) single-photon avalanche diode (SPAD) detector.Micro-scale spatially offset Raman spectroscopy for non-invasive subsurface analysis of turbid materials.Tissue phantoms to compare spatial and temporal offset modes of deep Raman spectroscopy.Combining Raman and laser induced breakdown spectroscopy by double pulse lasing.Will Raman meet bacteria on Mars? An overview of the optimal Raman spectroscopic techniques for carotenoid biomarkers detection on mineral backgroundsRaman spectroscopy for future planetary exploration: photodegradation, self-absorption and quantification of carotenoids in microorganisms and mineral matrices
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Time resolved Raman spectroscopy for depth analysis of multi-layered mineral samples
description
article
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im August 2013 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
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наукова стаття, опублікована в серпні 2013
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Time resolved Raman spectroscopy for depth analysis of multi-layered mineral samples
@en
Time resolved Raman spectroscopy for depth analysis of multi-layered mineral samples
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Time resolved Raman spectroscopy for depth analysis of multi-layered mineral samples
@en
Time resolved Raman spectroscopy for depth analysis of multi-layered mineral samples
@nl
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Time resolved Raman spectroscopy for depth analysis of multi-layered mineral samples
@en
Time resolved Raman spectroscopy for depth analysis of multi-layered mineral samples
@nl
P2093
P2860
P356
P1476
Time resolved Raman spectroscopy for depth analysis of multi-layered mineral samples
@en
P2093
Cees Gooijer
Freek Ariese
Gareth R. Davies
Ingeborg E. Iping Petterson
Jan-Hein Hooijschuur
P2860
P304
P356
10.1002/JRS.4369
P577
2013-08-27T00:00:00Z