Karel Hendrik Wouter van den Bos

Karel Hendrik Wouter van den Bos

Item
http://www.wikidata.org/entity/Q57940740
Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy techniques.Controlled growth of hexagonal gold nanostructures during thermally induced self-assembling on Ge(001) surface.Highly Emissive Divalent-Ion-Doped Colloidal CsPb1-xMxBr3 Perovskite Nanocrystals through Cation Exchange.Ligand-Induced Shape Transformation of PbSe NanocrystalsDisruption of the electrical conductivity of highly conductive poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) by hypochlorite.One Step Toward a New Generation of C-MOS Compatible Oxide P-N Junctions: Structure of the LSMO/ZnO Interface Elucidated by an Experimental and Theoretical Synergic Work.Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy.StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images.Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy.Locating light and heavy atomic column positions with picometer precision using ISTEM
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Karel Hendrik Wouter van den Bos

Item
http://www.wikidata.org/entity/Q57940740
description
researcher, ORCID id # 0000-0001-7353-735X
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name
Karel Hendrik Wouter van den Bos
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Karel Hendrik Wouter van den Bos
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Karel Hendrik Wouter van den Bos
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Karel Hendrik Wouter van den Bos
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type
label
Karel Hendrik Wouter van den Bos
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Karel Hendrik Wouter van den Bos
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Karel Hendrik Wouter van den Bos
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Karel Hendrik Wouter van den Bos
@nl
prefLabel
Karel Hendrik Wouter van den Bos
@ast
Karel Hendrik Wouter van den Bos
@en
Karel Hendrik Wouter van den Bos
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Karel Hendrik Wouter van den Bos
@nl
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P735
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