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Nanoscale Stoichiometric Analysis of a High-Temperature Superconductor by Atom Probe Tomography.Direct observation of individual hydrogen atoms at trapping sites in a ferritic steel.Comparing the Consistency of Atom Probe Tomography Measurements of Small-Scale Segregation and Clustering Between the LEAP 3000 and LEAP 5000 Instruments.Single-Ion Deconvolution of Mass Peak Overlaps for Atom Probe Microscopy.Quantification of oxide particle composition in model oxide dispersion strengthened steel alloys.Crystal Structure of the ZrO Phase at Zirconium/Zirconium Oxide Interfaces.Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEMOn the Use of Density-Based Algorithms for the Analysis of Solute Clustering in Atom Probe Tomography DataUltrafast electron diffraction pattern simulations using GPU technology. Applications to lattice vibrationsExploitation of thermal gradients for investigation of irradiation temperature effects with charged particlesAtom Probe Tomography Interlaboratory Study on Clustering Analysis in Experimental Data Using the Maximum Separation Distance ApproachQuantifying Uncertainty from Mass-Peak Overlaps in Atom Probe Microscopy
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P50
description
researcher, ORCID id # 0000-0001-6959-9849
@en
wetenschapper
@nl
name
Andrew J London
@ast
Andrew J London
@en
Andrew J London
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Andrew J London
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type
label
Andrew J London
@ast
Andrew J London
@en
Andrew J London
@es
Andrew J London
@nl
prefLabel
Andrew J London
@ast
Andrew J London
@en
Andrew J London
@es
Andrew J London
@nl
P106
P1153
56223665200
P31
P496
0000-0001-6959-9849