about
Accurate prediction of X-ray pulse properties from a free-electron laser using machine learningHELIOS--A laboratory based on high-order harmonic generation of extreme ultraviolet photons for time-resolved spectroscopy.Stimulated X-ray Raman scattering - a critical assessment of the building block of nonlinear X-ray spectroscopy.Ground state potential energy surfaces around selected atoms from resonant inelastic x-ray scatteringAnomalously strong two-electron one-photon X-ray decay transitions in CO caused by avoided crossing.Prospects of high-resolution resonant X-ray inelastic scattering studies on solid materials, liquids and gases at diffraction-limited storage rings.Core-valence double photoionization of the CS(2) molecule.Spectra of the triply charged ion CS(2)(3+) and selectivity in molecular Auger effects.Local electronic structure of functional groups in glycine as anion, zwitterion, and cation in aqueous solution.Direct observation of molecular orbital mixing in a solvated organometallic complex.Electronic structure of water molecules confined in a micelle lattice.High resolution multiphoton spectroscopy by a tunable free-electron-laser light.Rydberg-resolved resonant inelastic soft x-ray scattering: dynamics at core ionization thresholds.The electronic structure of perfluorodecalin studied by soft X-ray spectroscopy and electronic structure calculations.DMSO-Water Clustering in Solution Observed in Soft X-ray Spectra.The chemical bond in carbonyl and sulfinyl groups studied by soft X-ray spectroscopy and ab initio calculations.Photoelectron soft x-ray fluorescence coincidence spectroscopy on free molecules.Angular anisotropy of resonant inelastic soft x-ray scattering from liquid waterPhotoinduced Formation of N2Molecules in Ammonium CompoundsX-ray yield and selectively excited X-ray emission spectra of atenolol and nadololBulk electronic structure ofK3C60as revealed by soft x-raysRadiative and relativistic effects in the decay of highly excited states in heliumDetermination of absorption coefficients for concentrated samples by fluorescence detectionExtended x-ray-absorption fine structure above the Co L2,3 edges in ion-beam-synthesized CoSi2Electronic structures of alpha -Fe2O3 and Fe3O4 from O K-edge absorption and emission spectroscopyElectronic-structure determination of ion-beam-synthesized CoSi2 using photon-in-photon-out spectroscopiesExchange-split Ca 3s-13d states in CaF2 observed in threshold excited core-to-core fluorescenceResonant behavior in soft x-ray fluorescence excited by monochromatized synchrotron radiationSynchrotron-radiation-excited soft-x-ray-fluorescence studies of Cu and Zn: On the validity of the sudden approximationExcitation-energy dependence in the L2,3 fluorescence spectrum of SiSoft-x-ray-emission spectra of solid Kr and XeSoft-x-ray resonant inelastic scattering at the C K edge of diamondDetermination of the exchange splitting of the shape resonance of O2 using the core hole decay spectrum as a "fingerprint."Photon energy dependence of the high resolution C 1s photoelectron spectrum of CO in the threshold regionX-ray emission spectroscopy of hydrogen bonding and electronic structure of liquid waterCollision spectroscopy of Ar8+ + He at low velocities (v<1 a.u.).Soft x-ray absorption and emission spectra and the electronic structure of the Ba2YCu3O7-x superconductorElectron correlation in CaF2 studied in threshold-excited soft-x-ray fluorescenceElectronic structure of buried alpha -FeSi2 and beta -FeSi2 layers: Soft-x-ray-emission and -absorption studies compared to band-structure calculationsSelectively excited core-to-core fluorescence of potassium halides
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P50
description
researcher, ORCID id # 0000-0003-1467-8114
@en
wetenschapper
@nl
name
Jan-Erik Rubensson
@ast
Jan-Erik Rubensson
@en
Jan-Erik Rubensson
@es
Jan-Erik Rubensson
@nl
type
label
Jan-Erik Rubensson
@ast
Jan-Erik Rubensson
@en
Jan-Erik Rubensson
@es
Jan-Erik Rubensson
@nl
prefLabel
Jan-Erik Rubensson
@ast
Jan-Erik Rubensson
@en
Jan-Erik Rubensson
@es
Jan-Erik Rubensson
@nl
P214
P106
P1153
7003377433
P214
P31
P496
0000-0003-1467-8114
P7859
lccn-no2017053347