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Universal distributions for growth processes in 1+1 dimensions and random matricesReal-Time Observation of Structural and Orientational Transitions during Growth of Organic Thin FilmsRapid Roughening in Thin Film Growth of an Organic Semiconductor (Diindenoperylene)Scaling Properties of Pinned Interfaces in Fractal MediaInterface dynamics from experimental dataInfluence of pulsed laser heating on morphological relaxation of surface ripples.Epitaxial growth with pulsed deposition: submonolayer scaling and Villain instability.Maximal height statistics for 1/f(alpha) signals.Dependence of friction on roughness, velocity, and temperature.Efficient scheme for parametric fitting of data in arbitrary dimensions.Anomalous front broadening during spontaneous imbibition in a matrix with elongated pores.Migration mechanism of a GaN bicrystalline grain boundary as a model system.Organic-organic heterostructures: concepts and applications.Experimental study of stable imbibition displacements in a model open fracture. I. Local avalanche dynamics.Smoothening in thin-film deposition on rough substrates.Scaling in complex systems: a link between the dynamics of networks and growing interfaces.Parameter-free scaling relation for nonequilibrium growth processes.A hybrid kinetic Monte Carlo method for simulating silicon films grown by plasma-enhanced chemical vapor deposition.Faceting of a growing crystal surface by surface diffusion.Scaling and width distributions of parity-conserving interfaces.Sign-time distributions for interface growth.Strongly anisotropic roughness in surfaces driven by an oblique particle flux.Interfacial states and far-from-equilibrium transitions in the epitaxial growth and erosion on (110) crystal surfaces.Vertical asymmetry and the ripple-rotation transition in epitaxial growth and erosion on (110) crystal surfaces.Dislocation dynamics and surface coarsening of rippled states in the epitaxial growth and erosion on (110) crystal surfaces.Changing growth conditions during surface growth.Beyond the Young-Laplace model for cluster growth during dewetting of thin films: effective coarsening exponents and the role of long range dewetting interactions.Accelerated transport and growth with symmetrized dynamics.Extremal paths, the stochastic heat equation, and the three-dimensional Kardar-Parisi-Zhang universality class.Searching for the Tracy-Widom distribution in nonequilibrium processes.Atomic size effects in continuum modeling.Static fluctuations of a thick one-dimensional interface in the 1+1 directed polymer formulation: numerical study.Morphological stabilization and KPZ scaling by electrochemically induced co-deposition of nanostructured NiW alloy films.Restricted curvature model with suppression of extremal height.Exact short-time height distribution in the one-dimensional Kardar-Parisi-Zhang equation with Brownian initial condition.Limits of size scalability of diffusion and growth: Atoms versus molecules versus colloids.Local average height distribution of fluctuating interfaces.Finite-size effects in roughness distribution scaling.Short-time height distribution in the one-dimensional Kardar-Parisi-Zhang equation: Starting from a parabola.Width and extremal height distributions of fluctuating interfaces with window boundary conditions.
P2860
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P2860
description
wetenschappelijk artikel
@nl
наукова стаття, опублікована у квітні 1997
@uk
name
Origins of scale invariance in growth processes
@en
Origins of scale invariance in growth processes
@nl
type
label
Origins of scale invariance in growth processes
@en
Origins of scale invariance in growth processes
@nl
prefLabel
Origins of scale invariance in growth processes
@en
Origins of scale invariance in growth processes
@nl
P2860
P1433
P1476
Origins of scale invariance in growth processes
@en
P2093
Joachim Krug
P2860
P304
P356
10.1080/00018739700101498
P407
P577
1997-04-01T00:00:00Z