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Dynamic nano-triboelectrification using torsional resonance mode atomic force microscopy.Invited review article: practical guide for pyroelectric measurements.PlatypusMulti-dimensional modelling of electrostatic force distance curve over dielectric surface: Influence of tip geometry and correlation with experimentKelvin force microscopy characterization of charging effect in thin a-SiOxNy:H layers deposited in pulsed plasma enhanced chemical vapor deposition process by tuning the Silicon-environment
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description
im Juni 2009 veröffentlichter wissenschaftlicher Artikel
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scientific article published on 03 June 2009
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wetenschappelijk artikel
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наукова стаття, опублікована в червні 2009
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name
Detection of charge distributions in insulator surfaces
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Detection of charge distributions in insulator surfaces
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type
label
Detection of charge distributions in insulator surfaces
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Detection of charge distributions in insulator surfaces
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prefLabel
Detection of charge distributions in insulator surfaces
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Detection of charge distributions in insulator surfaces
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P50
P356
P1476
Detection of charge distributions in insulator surfaces
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P2093
F Galembeck
P304
P356
10.1088/0953-8984/21/26/263002
P577
2009-06-03T00:00:00Z