Discriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopy
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Discriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopy
description
im Juni 2014 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
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наукова стаття, опублікована в червні 2014
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name
Discriminating short-range fro ...... ontact atomic force microscopy
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Discriminating short-range fro ...... ontact atomic force microscopy
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type
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Discriminating short-range fro ...... ontact atomic force microscopy
@en
Discriminating short-range fro ...... ontact atomic force microscopy
@nl
prefLabel
Discriminating short-range fro ...... ontact atomic force microscopy
@en
Discriminating short-range fro ...... ontact atomic force microscopy
@nl
P2860
P1433
P1476
Discriminating short-range fro ...... ontact atomic force microscopy
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P2093
Philipp Rahe
Stefan Kuhn
P2860
P356
10.1103/PHYSREVB.89.235417
P407
P577
2014-06-13T00:00:00Z