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Elemental Distribution in Multilayer Systems by Laser-Assisted Atom Probe Tomography with Various Analysis Directions.Influence of laser power on atom probe tomographic analysis of boron distribution in silicon.A New Method for Size Estimation of Cu Nano-precipitates in Fe Based on Positron Quantum-dot ConfinementPositron annihilation in cardo-based polymer membranes
P50
description
researcher ORCID ID = 0000-0001-5166-653X
@en
wetenschapper
@nl
name
Takeshi Toyama
@ast
Takeshi Toyama
@en
Takeshi Toyama
@es
Takeshi Toyama
@nl
type
label
Takeshi Toyama
@ast
Takeshi Toyama
@en
Takeshi Toyama
@es
Takeshi Toyama
@nl
prefLabel
Takeshi Toyama
@ast
Takeshi Toyama
@en
Takeshi Toyama
@es
Takeshi Toyama
@nl
P31
P496
0000-0001-5166-653X