about
Comparison between diffraction contrast tomography and high-energy diffraction microscopy on a slightly deformed aluminium alloy.A rotational and axial motion system load frame insert for in situ high energy x-ray studies.Using x-ray reflectivity to determine the structure of surfactant monolayersCrystallographic character of grain boundaries resistant to hydrogen-assisted fracture in Ni-base alloy 725Anomalous phase behavior of long chain saturated lecithin bilayers.Kinetics of subgel formation in DPPC: X-ray diffraction proves nucleation-growth hypothesisComment on "Two-dimensional pressure of 4He monolayers: First-order melting of the incommensurate solid"Melting of monolayer xenon on silver: The hexatic phase in the weak-substrate limitCritical Fluctuations in MembranesLocation of the tricritical point for the melting of commensurate solid krypton on ZYX graphiteThermodynamics of first-order and continuous melting of xenon on graphiteThermodynamics of freezing in two dimensions: The compressibility of monolayer xenon on graphiteNonlinear oscillations in electrochemical growth of Zn dendritesOrder and disorder in fully hydrated unoriented bilayers of gel-phase dipalmitoylphosphatidylcholineTheory of the structure factor of lipid bilayersThermodynamics and phase diagram of multilayer krypton on graphiteReentrant disordered phase in two-layer films of Kr on graphite
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description
researcher ORCID ID = 0000-0002-0651-0437
@en
wetenschapper
@nl
name
Robert M Suter
@ast
Robert M Suter
@en
Robert M Suter
@es
Robert M Suter
@nl
type
label
Robert M Suter
@ast
Robert M Suter
@en
Robert M Suter
@es
Robert M Suter
@nl
prefLabel
Robert M Suter
@ast
Robert M Suter
@en
Robert M Suter
@es
Robert M Suter
@nl
P31
P496
0000-0002-0651-0437