Tomographic investigation of fermi level pinning at focused ion beam milled semiconductor surfaces
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Tomographic investigation of fermi level pinning at focused ion beam milled semiconductor surfaces
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im Dezember 2013 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
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наукова стаття, опублікована в грудні 2013
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name
Tomographic investigation of f ...... milled semiconductor surfaces
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Tomographic investigation of f ...... milled semiconductor surfaces
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type
label
Tomographic investigation of f ...... milled semiconductor surfaces
@en
Tomographic investigation of f ...... milled semiconductor surfaces
@nl
prefLabel
Tomographic investigation of f ...... milled semiconductor surfaces
@en
Tomographic investigation of f ...... milled semiconductor surfaces
@nl
P2093
P356
P1476
Tomographic investigation of f ...... milled semiconductor surfaces
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P2093
P304
P356
10.1063/1.4858957
P50
P577
2013-12-23T00:00:00Z