Comparison of 3D potential structures at different pn-junctions in FIB-prepared silicon and germanium samples measured by electron-holographic tomography
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Comparison of 3D potential structures at different pn-junctions in FIB-prepared silicon and germanium samples measured by electron-holographic tomography
description
wetenschappelijk artikel
@nl
name
Comparison of 3D potential str ...... lectron-holographic tomography
@en
Comparison of 3D potential str ...... lectron-holographic tomography
@nl
type
label
Comparison of 3D potential str ...... lectron-holographic tomography
@en
Comparison of 3D potential str ...... lectron-holographic tomography
@nl
prefLabel
Comparison of 3D potential str ...... lectron-holographic tomography
@en
Comparison of 3D potential str ...... lectron-holographic tomography
@nl
P2093
P1476
Comparison of 3D potential str ...... lectron-holographic tomography
@en
P2093
P356
10.1007/978-3-540-85226-1_11