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Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams.Yields and images of secondary ions from organic materials by different primary Bi ions in time-of-flight secondary ion mass spectrometry.Matrix-free high-resolution imaging mass spectrometry with high-energy ion projectiles.Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beamsStudy on the detection limits of a new argon gas cluster ion beam secondary ion mass spectrometry apparatus using lipid compound samplesOptimized Alkali-Metal Cationization in Secondary Ion Mass Spectrometry of Polyethylene Glycol Oligomers with up to m/z 10000: Dependence on Cation Species and Concentration
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description
researcher (ORCID 0000-0002-5926-4903)
@en
wetenschapper
@nl
name
Takaaki Aoki
@en
Takaaki Aoki
@nl
type
label
Takaaki Aoki
@en
Takaaki Aoki
@nl
prefLabel
Takaaki Aoki
@en
Takaaki Aoki
@nl
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P496
0000-0002-5926-4903