Properties of C84 and C24H12 molecular ion sources for routine TOF-SIMS analysis

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Properties of C84 and C24H12 molecular ion sources for routine TOF-SIMS analysis

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scientific article published on 07 September 2007

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Properties of C84 and C24H12 molecular ion sources for routine TOF-SIMS analysis

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Properties of C84 and C24H12 molecular ion sources for routine TOF-SIMS analysis

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Properties of C84 and C24H12 molecular ion sources for routine TOF-SIMS analysis

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P1476

Properties of C84 and C24H12 molecular ion sources for routine TOF-SIMS analysis

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P2093

Alan M Piwowar

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Gregory X Biddulph

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John C Vickerman

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Nicholas P Lockyer

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P304

7259-7266

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P31

scholarly article

P356

10.1021/AC071442X

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P433

http://www.w3.org/2001/XMLSchema#string

P478

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P50

John S Fletcher

P577

2007-09-07T00:00:00Z

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P698

17822312

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