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On-the-Fly Data Assessment for High-Throughput X-ray Diffraction Measurements.Evidence That the Anomalous Emission from CaF2:Yb2+ Is Not Described by the Impurity Trapped Exciton Model.Dynamic Optical Tuning of Interlayer Interactions in the Transition Metal Dichalcogenides.Finding a Needle in the Haystack: Identification of Functionally Important Minority Phases in an Operating Battery.An Inter-Laboratory Study of Zn-Sn-Ti-O Thin Films using High-Throughput Experimental Methods
P50
description
researcher
@en
wetenschapper
@nl
name
Apurva Mehta
@en
Apurva Mehta
@nl
type
label
Apurva Mehta
@en
Apurva Mehta
@nl
prefLabel
Apurva Mehta
@en
Apurva Mehta
@nl
P31
P496
0000-0003-0870-6932