Characterizing the intrinsic properties of individual XFEL pulses via single-particle diffraction
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Characterizing the intrinsic properties of individual XFEL pulses via single-particle diffraction
description
scientific article published on 01 January 2020
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name
Characterizing the intrinsic p ...... ia single-particle diffraction
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type
label
Characterizing the intrinsic p ...... ia single-particle diffraction
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prefLabel
Characterizing the intrinsic p ...... ia single-particle diffraction
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P2093
P50
P1476
Characterizing the intrinsic p ...... ia single-particle diffraction
@en
P2093
Changyong Song
Chulho Jung
Daeho Sung
Do Hyung Cho
Do Young Noh
Huaidong Jiang
Hyun Chol Kang
Jaeyong Shin
Jiadong Fan
Kangwoo Ahn
P356
10.1107/S1600577519015443
P577
2020-01-01T00:00:00Z