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Q27306877-8D601467-8505-4077-B94F-45C0CF65ABC4
Q27306877-8D601467-8505-4077-B94F-45C0CF65ABC4
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http://www.wikidata.org/entity/statement/Q27306877-8D601467-8505-4077-B94F-45C0CF65ABC4
Electron Beam Induced Artifacts During in situ TEM Deformation of Nanostructured Metals
P2860
Q27306877-8D601467-8505-4077-B94F-45C0CF65ABC4
BestRank
Statement
http://www.wikidata.org/entity/statement/Q27306877-8D601467-8505-4077-B94F-45C0CF65ABC4
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0152571f608c5e8ed003f2cf6e59a8b3495dd629
P2860
Combination of in situ straining and ACOM TEM: a novel method for analysis of plastic deformation of nanocrystalline metals.