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Q37421700-2FD39F5A-E434-4F02-A1BF-7DBC832CCB21
Q37421700-2FD39F5A-E434-4F02-A1BF-7DBC832CCB21
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http://www.wikidata.org/entity/statement/Q37421700-2FD39F5A-E434-4F02-A1BF-7DBC832CCB21
Automatic particle selection from electron micrographs using machine learning techniques
P2860
Q37421700-2FD39F5A-E434-4F02-A1BF-7DBC832CCB21
BestRank
Statement
http://www.wikidata.org/entity/statement/Q37421700-2FD39F5A-E434-4F02-A1BF-7DBC832CCB21
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ae2b58cc9dc9c03a7ee59791e8d3838a6ae77f68
P2860
Detecting circular and rectangular particles based on geometric feature detection in electron micrographs.