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Q38677869-B28F54C6-79E6-4573-B4AD-11A897D4D2A0
Q38677869-B28F54C6-79E6-4573-B4AD-11A897D4D2A0
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http://www.wikidata.org/entity/statement/Q38677869-B28F54C6-79E6-4573-B4AD-11A897D4D2A0
Quantitative Analysis of Electron Beam Damage in Organic Thin Films
P2860
Q38677869-B28F54C6-79E6-4573-B4AD-11A897D4D2A0
BestRank
Statement
http://www.wikidata.org/entity/statement/Q38677869-B28F54C6-79E6-4573-B4AD-11A897D4D2A0
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wasDerivedFrom
98b1a38c40aa19d4969290202c60342f7a2454a2
P2860
Electron Beam Induced Artifacts During in situ TEM Deformation of Nanostructured Metals