Progress towards an optimal specimen support for electron cryomicroscopy
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Specimen Preparation for High-Resolution Cryo-EMAdvances in the field of single-particle cryo-electron microscopy over the last decade.Measuring the effects of particle orientation to improve the efficiency of electron cryomicroscopy.A precision cryostat design for manual and semi-automated cryo-plunge instruments.Observation of Bacteriophage Ultrastructure by Cryo-electron Microscopy.Ewald sphere correction using a single side-band image processing algorithm.Cryo-EM Grid Preparation of Membrane Protein Samples for Single Particle AnalysisSub-2 Å Ewald curvature corrected structure of an AAV2 capsid variant
P2860
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P2860
Progress towards an optimal specimen support for electron cryomicroscopy
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2016 nî lūn-bûn
@nan
2016 թուականի Ապրիլին հրատարակուած գիտական յօդուած
@hyw
2016 թվականի ապրիլին հրատարակված գիտական հոդված
@hy
2016年の論文
@ja
2016年論文
@yue
2016年論文
@zh-hant
2016年論文
@zh-hk
2016年論文
@zh-mo
2016年論文
@zh-tw
2016年论文
@wuu
name
Progress towards an optimal specimen support for electron cryomicroscopy
@ast
Progress towards an optimal specimen support for electron cryomicroscopy
@en
Progress towards an optimal specimen support for electron cryomicroscopy
@nl
type
label
Progress towards an optimal specimen support for electron cryomicroscopy
@ast
Progress towards an optimal specimen support for electron cryomicroscopy
@en
Progress towards an optimal specimen support for electron cryomicroscopy
@nl
prefLabel
Progress towards an optimal specimen support for electron cryomicroscopy
@ast
Progress towards an optimal specimen support for electron cryomicroscopy
@en
Progress towards an optimal specimen support for electron cryomicroscopy
@nl
P2860
P1476
Progress towards an optimal specimen support for electron cryomicroscopy
@en
P2860
P356
10.1016/J.SBI.2015.12.007
P407
P577
2016-04-01T00:00:00Z