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Optimal beam sources for Stark decelerators in collision experiments: a tutorial reviewMethod for validating radiobiological samples using a linear accelerator.Applications of Raman micro-spectroscopy to stem cell technology: label-free molecular discrimination and monitoring cell differentiation.Analysis of velocity-mapped ion images from high-resolution crossed-beam scattering experiments: a tutorial review.Characterization of a gold coated cantilever surface for biosensing applications.Novel experimental setup for time-of-flight mass spectrometry ion detection in collisions of anionic species with neutral gas-phase molecular targets“The Even-Lavie valve as a source for high intensity supersonic beam”Erratum to: Analysis of velocity-mapped ion images from high-resolution crossed-beam scattering experiments: a tutorial reviewDesign of a Mars atmosphere simulation chamber and testing a Raman Laser Spectrometer (RLS) under conditions pertinent to Mars rover missionsFabrication of ion-trap electrodes by self-terminated electrochemical etchingMerged neutral beamsInfluence of squeeze-film damping on higher-mode microcantilever vibrations in liquidDesign strategies for controlling damping in micromechanical and nanomechanical resonatorsDesign strategies for controlling damping in micromechanical and nanomechanical resonatorsEPJ Techniques and InstrumentionOn-chip cavity optomechanical couplingReal-time gas identification on mobile platforms using a nanomechanical membrane-type surface stress sensorPhotothermal cantilever deflection spectroscopyNovel method for state selective determination of electron-impact-excitation cross sections from 0° to 180°Development of a 3He magnetometer for a neutron electric dipole moment experimentDirect IR excitation in a fast ion beam: application to NO- photodetachment cross sectionsTrapping molecules on chipsEnergy influx measurements with an active thermal probe in plasma-technological processesImplementation of simultaneous quantitative phase with Raman imagingTip-enhanced Raman spectroscopy: principles and applicationsPPMS-based set-up for Raman and luminescence spectroscopy at high magnetic field, high pressure and low temperatureA microfluidic AFM cantilever based dispensing and aspiration platformReview of multidimensional data processing approaches for Raman and infrared spectroscopyAn optimized measurement chamber for cantilever array measurements in liquid incorporating an automated sample handling systemDesign and characterization of a linear quadrupole ion trap for high-resolution Coulomb-crystal time-of-flight mass spectrometryErratum to: ‘A microfluidic AFM cantilever based dispensing and aspiration platform’Methods of gas purification and effect on the ion composition in an RF atmospheric pressure plasma jet investigated by mass spectrometryPerformance of the EUDET-type beam telescopesAnisotropic friction: assessment of force components and resulting trajectoriesRydberg-Stark deceleration of atoms and moleculesSympathetic cooling of molecular ions with ultracold atomsNano-jet related to Bessel beams and to super-resolutions in microsphere optical experimentsOptimizing the density of Stark decelerated radicals at low final velocities: a tutorial reviewAnalysis of passive calorimetric probe measurements at high energy influxesDependence of the confinement time of an electron plasma on the magnetic field in a quadrupole Penning trap
P1433
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P1433
description
journal
@en
revista científica
@es
wetenschappelijk tijdschrift van Springer Science+Business Media
@nl
wissenschaftliche Fachzeitschrift
@de
name
EPJ techniques and instrumentation
@ast
EPJ techniques and instrumentation
@en
EPJ techniques and instrumentation
@es
EPJ techniques and instrumentation
@nl
type
label
EPJ techniques and instrumentation
@ast
EPJ techniques and instrumentation
@en
EPJ techniques and instrumentation
@es
EPJ techniques and instrumentation
@nl
altLabel
EPJ Tech Instrum
@en
prefLabel
EPJ techniques and instrumentation
@ast
EPJ techniques and instrumentation
@en
EPJ techniques and instrumentation
@es
EPJ techniques and instrumentation
@nl
P31
P3181
P1055
P1476
EPJ techniques and instrumentation
@en