Origin of the training effect and asymmetry of the magnetization in polycrystalline exchange bias systems.
about
Direct measurement of rotatable and frozen CoO spins in exchange bias system of CoO/Fe/Ag(001).Simultaneous polarized neutron reflectometry and anisotropic magnetoresistance measurements.Recovery of the training effect in exchange bias systems within a coherent rotation modelInterdependence between training and magnetization reversal in granular Co-CoO exchange bias systemsTuning the ferromagnetic-antiferromagnetic interfaces of granular Co-CoO exchange bias systems by annealingModification of the magnetic properties of Co films grown on MgO (100) by treatment with NaOH solutionSeparation of low- and high-temperature contributions to the exchange bias in Ni81Fe19-NiO thin filmsComposition-controlled exchange bias training effect in FeCr/IrMn bilayers
P2860
Q53074266-4C181E1D-D282-4455-B744-E3B82C9CCDC3Q53082779-9C4CB7C3-7ABD-4005-8966-07180A1853A9Q57574686-25EC2653-6EFB-4E62-AEB0-B8551DB46D56Q57672884-57FFE5B5-B064-4BA1-A311-5E6DAB352416Q57672902-A9DEC829-9420-4D0C-817D-E689FFCBF71CQ57911234-E4C27A7C-EDB2-4903-9527-0EEAB5FB5A98Q58619866-7CFA241A-B2D1-4BD9-90C2-DDB2C63BB620Q58619894-4BE68943-F615-477F-A27C-ACC5932AAFC4
P2860
Origin of the training effect and asymmetry of the magnetization in polycrystalline exchange bias systems.
description
2007 nî lūn-bûn
@nan
2007年の論文
@ja
2007年学术文章
@wuu
2007年学术文章
@zh
2007年学术文章
@zh-cn
2007年学术文章
@zh-hans
2007年学术文章
@zh-my
2007年学术文章
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2007年學術文章
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2007年學術文章
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name
Origin of the training effect ...... talline exchange bias systems.
@en
Origin of the training effect ...... talline exchange bias systems.
@nl
type
label
Origin of the training effect ...... talline exchange bias systems.
@en
Origin of the training effect ...... talline exchange bias systems.
@nl
prefLabel
Origin of the training effect ...... talline exchange bias systems.
@en
Origin of the training effect ...... talline exchange bias systems.
@nl
P2093
P2860
P1476
Origin of the training effect ...... talline exchange bias systems.
@en
P2093
Chris Van Haesendonck
Kristiaan Temst
Steven Brems
P2860
P304
P356
10.1103/PHYSREVLETT.99.067201
P407
P577
2007-08-09T00:00:00Z