Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials.

about

Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials.

Item

http://www.wikidata.org/entity/Q54969299

description

2018 nî lūn-bûn

@nan

2018年の論文

@ja

2018年学术文章

@wuu

2018年学术文章

@zh-cn

2018年学术文章

@zh-hans

2018年学术文章

@zh-my

2018年学术文章

@zh-sg

2018年學術文章

@yue

2018年學術文章

@zh

2018年學術文章

@zh-hant

name

Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials.

@en

Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials.

@nl

type

Item

label

Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials.

@en

Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials.

@nl

prefLabel

Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials.

@en

Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials.

@nl

P1476

Quantification and optimization of ADF-STEM image contrast for beam-sensitive materials

@en

P2093

Heiner Friedrich

http://www.w3.org/2001/XMLSchema#string

P2860

Virtual nanoscopy: generation of ultra-large high resolution electron microscopy maps

Influence of detector geometry on image properties of the STEM for thick objects.

A new experimental procedure to quantify annular dark field images in scanning transmission electron microscopy.

Monte Carlo electron-trajectory simulations in bright-field and dark-field STEM: implications for tomography of thick biological sections.

Application of image processing to STEM tomography of low-contrast materials.

Three-dimensional scanning transmission electron microscopy of biological specimens.

Optimization of STEM tomography acquisition--a comparison of convergent beam and parallel beam STEM tomography.

Simulating STEM imaging of nanoparticles in micrometers-thick substrates.

High-resolution low-dose scanning transmission electron microscopy.

Z dependence of electron scattering by single atoms into annular dark-field detectors.

P304

171838

http://www.w3.org/2001/XMLSchema#string

P31

scholarly article

P356

10.1098/RSOS.171838

http://www.w3.org/2001/XMLSchema#string

P433

http://www.w3.org/2001/XMLSchema#string

P478

http://www.w3.org/2001/XMLSchema#string

P50

Karthikeyan Gnanasekaran

Gijsbertus de With

P577

2018-05-02T00:00:00Z

http://www.w3.org/2001/XMLSchema#dateTime

P698

29892376

http://www.w3.org/2001/XMLSchema#string

P932

5990820

http://www.w3.org/2001/XMLSchema#string