Park Systems
Park Systems Corp. was founded as PSIA in 1997 by Dr. Sang-il Park, a co-founder of Park Scientific Instruments, one of the pioneers in developing commercialized AFM. PSIA changed its name to Park Systems to reflect the company’s focus on total metrological solutions and AFM and SPM (scanning probe microscopes) for both small and large-sample measurement, Near-field Scanning Optical Microscopy (NSOM) and Raman spectrometry. In addition, the company also offers an industrial product line that extends its innovative XE technology to a variety of metrological applications, including hard disk inspection, next-generation sliders, sidewall/overhang imaging and profiling, and semiconductors.
Wikipage redirect
primaryTopic
Park Systems
Park Systems Corp. was founded as PSIA in 1997 by Dr. Sang-il Park, a co-founder of Park Scientific Instruments, one of the pioneers in developing commercialized AFM. PSIA changed its name to Park Systems to reflect the company’s focus on total metrological solutions and AFM and SPM (scanning probe microscopes) for both small and large-sample measurement, Near-field Scanning Optical Microscopy (NSOM) and Raman spectrometry. In addition, the company also offers an industrial product line that extends its innovative XE technology to a variety of metrological applications, including hard disk inspection, next-generation sliders, sidewall/overhang imaging and profiling, and semiconductors.
has abstract
Park Systems Corp. was founded ...... profiling, and semiconductors.
@en
founding date
1997-04-07
founding year
industry
key person
product
region served
thumbnail
type
Link from a Wikipage to an external page
Wikipage page ID
25,208,582
Wikipage revision ID
500,840,114
num employees
Over 100 - (Jan. 2010)
subject
comment
Park Systems Corp. was founded ...... profiling, and semiconductors.
@en
label
Park Systems
@en
wasDerivedFrom
depiction
homepage
isPrimaryTopicOf
name
Park Systems Corporation
@en