ASTM C 1270 is a Standard Practice for Detection Sensitivity Mapping of In-Plant Walk-Through Metal Detectors. This standard was created by the American Standard for Testing and Materials (ASTM) and published in December 1997. ASTM International which was funded in 1898, is an international standards developing organization that develops and publishes standards for a wide range of materials, products, systems, and services. This standard deals with a procedure to establish the weakest detection path through the portal aperture and the worst-case orthogonal orientation of metallic test objects. This practice is considered to develop the assistance about operators of walk-through metal detectors with meeting the metal detection performance requirements of the responsible regulatory authority