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1
1.3534007
1.3534007
http://dx.doi.org/10.1063/1.3534007
A high-vacuum deposition system for in situ and real-time electrical characterization of organic thin-film transistors
P356
Q56986838-1BB7BCA2-157F-45B2-9FF4-64D284893139
P356
1.3534007
http://dx.doi.org/10.1063/1.3534007