Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
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Roughening Rates of Strained-Layer InstabilitiesFlexible drift-compensation system for precise 3D force mapping in severe drift environments.Active drift compensation applied to nanorod manipulation with an atomic force microscope.Accurately determining single molecule trajectories of molecular motion on surfaces.Temperature calibration for diffusion experiments to sub-Kelvin precision.Direct observation of the dynamics of single metal ions at the interface with solids in aqueous solutions.Studying the dynamic behaviour of porphyrins as prototype functional molecules by scanning tunnelling microscopy close to room temperature.Diffusion kinetics in the Pd/Cu(001) surface alloy.Diffusional kinetics of SiGe dimers on Si(100) using atom-tracking scanning tunneling microscopyAnomalous Dynamical Behavior of Freestanding Graphene Membranes.Differential Electrochemical Conductance Imaging at the Nanoscale.Modelization of surface diffusion of a molecular dimer.Optical phonon sidebands of electronic intersubband absorption in strongly polar semiconductor heterostructures.Scanning nonlinear dielectric potentiometry.Experimental and Theoretical Study of the Rotation of Si Ad-dimers on the Si(100) SurfaceSi(001) step dynamics: A temporal low-energy electron diffraction studyCross-correlation image tracking for drift correction and adsorbate analysisUnusual ultra-low-frequency fluctuations in freestanding graphene
P2860
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P2860
Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
description
1996 nî lūn-bûn
@nan
1996 թուականի Յունուարին հրատարակուած գիտական յօդուած
@hyw
1996 թվականի հունվարին հրատարակված գիտական հոդված
@hy
1996年の論文
@ja
1996年論文
@yue
1996年論文
@zh-hant
1996年論文
@zh-hk
1996年論文
@zh-mo
1996年論文
@zh-tw
1996年论文
@wuu
name
Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
@ast
Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
@en
Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
@nl
type
label
Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
@ast
Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
@en
Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
@nl
prefLabel
Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
@ast
Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
@en
Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
@nl
P2860
P1476
Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy
@en
P2093
B. S. Swartzentruber
P2860
P304
P356
10.1103/PHYSREVLETT.76.459
P407
P577
1996-01-01T00:00:00Z
1996-01-15T00:00:00Z