about
sameAs
Multimodality hard-x-ray imaging of a chromosome with nanoscale spatial resolution.11 nm hard X-ray focus from a large-aperture multilayer Laue lens.Design of a variable temperature scanning force microscope.Design and characterization of a compact nano-positioning system for a portable transmission x-ray microscope.Design and performance of a scanning ptychography microscope.Fly-scan ptychographyA high-precision instrument for mapping of rotational errors in rotary stages.Pushing the limits: an instrument for hard X-ray imaging below 20 nm.Compact prototype apparatus for reducing the circle of confusion down to 40 nm for x-ray nanotomography.Hard x-ray scanning imaging achieved with bonded multilayer Laue lenses.Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography.Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges.Local ferromagnetic resonance imaging with magnetic resonance force microscopyMultimodal hard x-ray imaging with resolution approaching 10 nm for studies in material scienceArtifact mitigation of ptychography integrated with on-the-fly scanning probe microscopyDesign and performance of an X-ray scanning microscope at the Hard X-ray Nanoprobe beamline of NSLS-IIHigh resolution tip-tilt positioning system for a next generation MLL-based x-ray microscopeIn-situ synchrotron x-ray studies of the microstructure and stability of In2O3 epitaxial filmsDevelopment and characterization of monolithic multilayer Laue lens nanofocusing opticsMultilayer Laue Lens: A Brief History and Current StatusNm-scale spatial resolution X-ray imaging with MLL nanofocusing optics: Instrumentational requirements and challengesHard x-ray nanoprobe facility at the National Synchroton Light Source IIAchieving hard X-ray nanofocusing using a wedged multilayer Laue lensNanospectroscopy Captures Nanoscale Compositional Zonation in Barite Solid SolutionsHigh-speed raster-scanning synchrotron serial microcrystallography with a high-precision piezo-scannerDirect measurement of the magnetic penetration depth by magnetic force microscopyLarge magnetic penetration depth and thermal fluctuations in a superconducting Ca10(Pt3As8)[(Fe1−xPtx)2As2]5(x=0.097) single crystalMagnetic penetration-depth measurements of a suppressed superfluid density of superconducting Ca0.5Na0.5Fe2As2single crystals by proton irradiationResolving 500 nm axial separation by multi-slice X-ray ptychographyEffect of low-level radiation on the low temperature acoustic behavior of a-SiO2X-ray focusing with efficient high-NA multilayer Laue lensesDesign, characterization, and performance of a hard x-ray transmission microscope at the National Synchrotron Light Source II 18-ID beamlineMicroscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future DirectionsPerovskite neural trees
P50
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P50
description
hulumtues
@sq
onderzoeker
@nl
researcher
@en
հետազոտող
@hy
name
Evgeny Nazaretski
@ast
Evgeny Nazaretski
@en
Evgeny Nazaretski
@es
Evgeny Nazaretski
@nl
Evgeny Nazaretski
@sl
type
label
Evgeny Nazaretski
@ast
Evgeny Nazaretski
@en
Evgeny Nazaretski
@es
Evgeny Nazaretski
@nl
Evgeny Nazaretski
@sl
prefLabel
Evgeny Nazaretski
@ast
Evgeny Nazaretski
@en
Evgeny Nazaretski
@es
Evgeny Nazaretski
@nl
Evgeny Nazaretski
@sl
P106
P21
P31
P496
0000-0003-1207-8174