about
Progress in aberration-corrected high-resolution transmission electron microscopy using hardware aberration correction."Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.Negative spherical aberration ultrahigh-resolution imaging in corrected transmission electron microscopy.Real-time detection and single-pass minimization of TEM objective lens astigmatism.Structure determination of atomically controlled crystal architectures grown within single wall carbon nanotubes.
P2860
description
2000 nî lūn-bûn
@nan
2000 թուականի Մարտին հրատարակուած գիտական յօդուած
@hyw
2000 թվականի մարտին հրատարակված գիտական հոդված
@hy
2000年の論文
@ja
2000年論文
@yue
2000年論文
@zh-hant
2000年論文
@zh-hk
2000年論文
@zh-mo
2000年論文
@zh-tw
2000年论文
@wuu
name
A new way of measuring microscope aberrations
@ast
A new way of measuring microscope aberrations
@en
type
label
A new way of measuring microscope aberrations
@ast
A new way of measuring microscope aberrations
@en
prefLabel
A new way of measuring microscope aberrations
@ast
A new way of measuring microscope aberrations
@en
P1433
P1476
A new way of measuring microscope aberrations
@en
P2093
P356
10.1016/S0304-3991(99)00163-1
P577
2000-03-01T00:00:00Z