Determination of solid surface tension from particle-substrate pull-off forces measured with the atomic force microscope.
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Adhesion force mapping on wood by atomic force microscopy: influence of surface roughness and tip geometryDynamic self-cleaning in gecko setae via digital hyperextension.Towards screening of inhalation formulations: measuring interactions with atomic force microscopy.Hygiene and cleanability: a focus on surfaces.Theoretical models for surface forces and adhesion and their measurement using atomic force microscopy.A simple atomic force microscopy calibration method for direct measurement of surface energy on nanostructured surfaces covered with molecularly thin liquid films.Mesoscale scanning probe tips with subnanometer rms roughness.Modulation of hydrophobic interactions by proximally immobilized ions.Atomic force spectroscopy on poly(o-ethoxyaniline) nanostructured films: sensing nonspecific interactions.
P2860
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P2860
Determination of solid surface tension from particle-substrate pull-off forces measured with the atomic force microscope.
description
2004 nî lūn-bûn
@nan
2004 թուականի Դեկտեմբերին հրատարակուած գիտական յօդուած
@hyw
2004 թվականի դեկտեմբերին հրատարակված գիտական հոդված
@hy
2004年の論文
@ja
2004年論文
@yue
2004年論文
@zh-hant
2004年論文
@zh-hk
2004年論文
@zh-mo
2004年論文
@zh-tw
2004年论文
@wuu
name
Determination of solid surface ...... h the atomic force microscope.
@ast
Determination of solid surface ...... h the atomic force microscope.
@en
type
label
Determination of solid surface ...... h the atomic force microscope.
@ast
Determination of solid surface ...... h the atomic force microscope.
@en
prefLabel
Determination of solid surface ...... h the atomic force microscope.
@ast
Determination of solid surface ...... h the atomic force microscope.
@en
P2093
P1476
Determination of solid surface ...... h the atomic force microscope.
@en
P2093
Elvin R Beach
Garth W Tormoen
Jaroslaw Drelich
P304
P356
10.1016/J.JCIS.2004.08.002
P407
P577
2004-12-01T00:00:00Z