about
Three-dimensional nanostructure determination from a large diffraction data set recorded using scanning electron nanodiffraction.Three-dimensional orientation mapping in the transmission electron microscope.Nanometres-resolution Kikuchi patterns from materials science specimens with transmission electron forward scatter diffraction in the scanning electron microscope.On-axis versus off-axis Transmission Kikuchi Diffraction technique: application to the characterisation of severe plastic deformation-induced ultrafine-grained microstructures.Depth Resolution Dependence on Sample Thickness and Incident Energy in On-Axis Transmission Kikuchi Diffraction in Scanning Electron Microscope (SEM).
P2860
description
2003 nî lūn-bûn
@nan
2003 թուականի Օգոստոսին հրատարակուած գիտական յօդուած
@hyw
2003 թվականի օգոստոսին հրատարակված գիտական հոդված
@hy
2003年の論文
@ja
2003年論文
@yue
2003年論文
@zh-hant
2003年論文
@zh-hk
2003年論文
@zh-mo
2003年論文
@zh-tw
2003年论文
@wuu
name
Polycrystal orientation maps from TEM.
@ast
Polycrystal orientation maps from TEM.
@en
type
label
Polycrystal orientation maps from TEM.
@ast
Polycrystal orientation maps from TEM.
@en
prefLabel
Polycrystal orientation maps from TEM.
@ast
Polycrystal orientation maps from TEM.
@en
P2093
P1433
P1476
Polycrystal orientation maps from TEM.
@en
P2093
Fundenberger JJ
Lecomte JS
Morawiec A
P304
P356
10.1016/S0304-3991(02)00435-7
P577
2003-08-01T00:00:00Z