Development of a soft X-ray angle-resolved photoemission system applicable to 100 µm crystals.
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Soft X-ray angle-resolved photoemission with micro-positioning techniques for metallic V₂O₃.Polarized hard X-ray photoemission system with micro-positioning technique for probing ground-state symmetry of strongly correlated materialsWide-angle display-type retarding field analyzer with high energy and angular resolutions.
P2860
Development of a soft X-ray angle-resolved photoemission system applicable to 100 µm crystals.
description
2011 nî lūn-bûn
@nan
2011 թուականի Սեպտեմբերին հրատարակուած գիտական յօդուած
@hyw
2011 թվականի սեպտեմբերին հրատարակված գիտական հոդված
@hy
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
name
Development of a soft X-ray an ...... applicable to 100 µm crystals.
@ast
Development of a soft X-ray an ...... applicable to 100 µm crystals.
@en
type
label
Development of a soft X-ray an ...... applicable to 100 µm crystals.
@ast
Development of a soft X-ray an ...... applicable to 100 µm crystals.
@en
prefLabel
Development of a soft X-ray an ...... applicable to 100 µm crystals.
@ast
Development of a soft X-ray an ...... applicable to 100 µm crystals.
@en
P2093
P2860
P1476
Development of a soft X-ray an ...... applicable to 100 µm crystals
@en
P2093
Akira Sekiyama
Hiroyuki Okazaki
Shigemasa Suga
Takayoshi Yokoya
Takayuki Muro
Yoshio Watanabe
Yukako Kato
P2860
P304
P356
10.1107/S0909049511034418
P577
2011-09-21T00:00:00Z