Effect of citric acid concentration on dentin demineralization, dehydration, and rehydration: atomic force microscopy study.
about
Acid-etching and hydration influence on dentin roughness and wettability.Control Issues in High-speed AFM for Biological Applications: Collagen Imaging Example.Morphological/chemical imaging of demineralized dentin layer in its natural, wet state.Dentin caries zones: mineral, structure, and properties.The effect of a self-etching primer on the continuous demineralization of dentin.Recovery after PILP remineralization of dentin lesions created with two cariogenic acids.Automatization of nanotomography.
P2860
Q31407575-0C8A9399-D2E3-4E99-AD62-E5506D4E0D3EQ33233480-22269DAF-64B2-4756-A6D4-B1B3A454163CQ33751051-22A8AB00-C40E-454B-B72D-C0B9BDF92F70Q39868646-DBE52AA1-A320-4C61-92DC-FE35CD03197EQ45137656-0A314AE2-1490-4B34-BE1E-DDB63D200186Q45984558-56ECF7E3-A0BE-4A49-8A55-5818437D172BQ51913068-EDFBC76C-C407-4934-93C7-A43C10B64056
P2860
Effect of citric acid concentration on dentin demineralization, dehydration, and rehydration: atomic force microscopy study.
description
1998 nî lūn-bûn
@nan
1998 թուականի Դեկտեմբերին հրատարակուած գիտական յօդուած
@hyw
1998 թվականի դեկտեմբերին հրատարակված գիտական հոդված
@hy
1998年の論文
@ja
1998年論文
@yue
1998年論文
@zh-hant
1998年論文
@zh-hk
1998年論文
@zh-mo
1998年論文
@zh-tw
1998年论文
@wuu
name
Effect of citric acid concentr ...... atomic force microscopy study.
@ast
Effect of citric acid concentr ...... atomic force microscopy study.
@en
type
label
Effect of citric acid concentr ...... atomic force microscopy study.
@ast
Effect of citric acid concentr ...... atomic force microscopy study.
@en
prefLabel
Effect of citric acid concentr ...... atomic force microscopy study.
@ast
Effect of citric acid concentr ...... atomic force microscopy study.
@en
P2093
P2860
P1476
Effect of citric acid concentr ...... atomic force microscopy study.
@en
P2093
Marshall GW Jr
Marshall SJ
Watanabe LG
Wu-Magidi IC
P2860
P304
P356
10.1002/(SICI)1097-4636(19981215)42:4<500::AID-JBM4>3.0.CO;2-L
P577
1998-12-01T00:00:00Z